Features
♦ 4.3-inch Color LCD Display
♦ Fully Isolated Triple Channels with Independent Control
♦ Multiple Output Modes: Series, Parallel, and Synchronous
♦ Auto Range Mode for Versatile Testing Needs
♦ Transient Response Time: ≤50 μs
♦ High Accuracy: ≤0.02% + 3 mV / ≤0.03% + 1.5 mA
♦ Programming Response Time: 5 ms
♦ Low Output Ripple and Noise
♦ CC/CV Priority Modes
♦ Comprehensive Protection Features: OVP, UVP, OCP, UCP, OPP, OTP, and FOLDBACK
♦ Supports Local and Remote Sensing Modes
♦ Built-in USB, LAN, Digital I/O, and RS232 Communication Interfaces (on Select Models)
Graphical User Interface (GUI)
The IT-N6300 Series features a 4.3-inch color LCD display with English and Chinese language support, meeting diverse global needs. The intuitive interface enables easy parameter settings, waveform observation, and quick language switching, ensuring smooth operation for all users. This design enhances usability, improves user experience, and ensures compatibility across regions and applications.
Multiple Output Modes
The IT-N6300 Series integrates multiple built-in output modes, enabling flexible range expansion without the need for additional wiring. This streamlined design simplifies setup, reduces external cabling complexity, and minimizes errors caused by poor connections or intricate wiring, ensuring enhanced reliability and safety. With its capability to adapt to complex testing scenarios, the IT-N6300 Series boosts operational efficiency, improves measurement accuracy, and delivers a seamless, professional user experience.
List
The IT-N6300 Series features a LIST sequence editing function on each channel, allowing users to customize output waveforms and save them either to the device's internal memory or an external USB drive for future use. It also supports importing externally created waveform files for quick loading, eliminating the need for reconfiguration before testing. This capability streamlines the waveform setup process, improves testing efficiency, and offers users exceptional flexibility to handle a wide range of testing scenarios.